Տեղեկատվական տեխնոլոգիաների կրթական եվ հետազոտական կենտրոն
YSU Information Technologies Educational and Research Center
Established in 2007, IT Educational and Research Center (IT ERC) serves as an interdisciplinary hub for educational program. Headed by Prof. Samvel K. Shoukourian:
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“An Efficient 2-Phase March Algorithm for Full Diagnosis of All Simple Static Faults in Random Access Memories”
2007 | Article
IEEE East-West Design and Test Symposium (EWDTS), Armenia, 2007, pp. 110-113
“A Software Tool for Generation of March Algorithms for Faults in SRAMs”
2007 | Article
IEEE East-West Design and Test Symposium (EWDTS), Armenia, 2007, pp. 444-447
S..Shoukourian , Y.Zorian
Hierarchical Silicon Aware Test and Repair IP: Development and Integration Flow Reducing Time to Market for Systems on Chip
2006 | Thesis
Invited paper, 4th IEEE East-West Design and Test Workshop, Sochi, Russia, September 2006
T. Gyonjyan, V. A. Vardanian
“An Efficient Algorithm for Generating Minimal March Tests for Fault Detection and Diagnosis in Static Random Access Memories”
2006 | Thesis
International Design and Test Workshop, Dubai, November 19-20, 2006
Y. Zorian, G. Torjyan, A. Harutyunyan, V. Vardanian
Apparatus, method, and system to allocate redundant components with subsets of the redundant components
2006 | Article
US Patent, No. 7,149,921, USA, 2006
”Minimal March-Based Fault Location Algorithm with Partial Diagnosis for All Static Faults in Random Access Memories”
2006 | Article
IEEE Design and Diagnosis of Electronic Circuits and Systems (DDECS), Czech Republic, 2006, pp. 260-265
Minimal March Test Algorithm for Detection of Linked Static Faults in Random Access Memories”
2006 | Article
IEEE VLSI Test Symposium (VTS), USA, 2006, pp. 120-125
“Minimal March Tests for Dynamic Faults in Random Access Memories”
2006 | Article
IEEE European Test Symposium (ETS), UK, 2006, pp. 43-48
“A March Based Algorithm for Location and Full Diagnosis of All Unlinked Static Faults”
2006 | Article
IEEE Memory Technology, Design and Testing (MTDT), Taiwan, 2006, pp 9-14
“A March Test for Full Diagnosis of All Simple Static Faults in Random Access Memories”
2006 | Article
IEEE East-West Design and Test Workshop (EWDTW), Russia, 2006, pp. 68-71
 
Contacts
Contacts
YSU, Build. D4, 1 A. Manoogian Street, Yerevan, 0025 Armenia

Tel.: (+374 60) 71-00-44 (inner line 10-44)
it_center@ysu.am