Տեղեկատվական տեխնոլոգիաների կրթական եւ հետազոտական կենտրոն
YSU Information Technologies Educational and Research Center
Established in 2007, IT Educational and Research Center (IT ERC) serves as an interdisciplinary hub for educational program. Headed by Prof. Samvel K. Shoukourian:
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D. Sargsyan, Gurgen Harutyunyan , Samvel K. Shoukourian , Yervant Zorian
Automated flow for test pattern creation for IPs in SoC
2017 | Article
EWDTS. 2017: 21-24 pp
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S. Martirosyan, Gurgen Harutyunyan , Samvel K. Shoukourian , Yervant Zorian
An efficient testing methodology for embedded flash memories
2017 | Article
EWDTS. 2017: 422-425 pp
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Խնդիրների լուծում Prolog լեզվով
2016 | Book
ԵՊՀ հրատ.: 2016թ․, 114 էջ
Նորաբաննությունները Գուրգեն Խանջյանի ստեղծագործություններում
2016 | Article
Երիտասարդ լեզվաբանների հանրապետական 6-րդ գիտաժողով: 2016, 80-90 էջ
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S. Shoukourian, G. Tshagharyan, G. Harutynyan, Y. Zorian
Securing Test Infrastructure of System-on-Chips
2016 | Article
IEEE East-West Design and Test Symposium. 2016, p. 29-32
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G. Tshagharyan, Gurgen Harutyunyan , Samvel K. Shoukourian , Yervant Zorian
Experimental study on Hamming and Hsiao codes in the context of embedded applications
2016 | Article
EWDTS, 2017: 25-28 pp.
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Lusine Martirosyan, Gurgen Harutyunyan , Samvel K. Shoukourian , Yervant Zorian
A power based memory BIST grouping methodology
2015 | Article
East-West Design & Test Symposium (EWDTS). 2015, p. 27-30
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Grigor Tshagharyan, Gurgen Harutyunyan , Samvel K. Shoukourian , Yervant Zorian
Overview study on fault modeling and test methodology development for FinFET-based memories
2015 | Article
East-West Design & Test Symposium (EWDTS). 2015, p. 19-22
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Grigor Tshagharyan, Gurgen Harutyunyan , Samvel K. Shoukourian , Yervant Zorian
Overview study on fault modeling and test methodology development for FinFET-based memories
2015 | Article
East-West Design & Test Symposium (EWDTS), Batumi, Georgia September 26-29, 2015, pp. 5-9 (english)
Vrezh Sargsyan, Valery A. Vardanian , Samvel K. Shoukourian , Yervant Zorian, Avetik Yessayan
An efficient approach for memory repair by reducing the number of spares
2015 | Article
East-West Design & Test Symposium (EWDTS) Batumi, Georgia September 26-29, 2015, pp. 21-25 (english)
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Contacts
Contacts
YSU, Build. D4, 1 A. Manoogian Street, Yerevan, 0025 Armenia

Tel.: (+374 60) 71-00-44 (inner line 10-44)
it_center@ysu.am