Տեղեկատվական տեխնոլոգիաների կրթական եւ հետազոտական կենտրոն
YSU Information Technologies Educational and Research Center
Established in 2007, IT Educational and Research Center (IT ERC) serves as an interdisciplinary hub for educational program. Headed by Prof. Samvel K. Shoukourian:
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Manukyan M. G. , Gevorgyan G. R.
An XML Mediator Based on the AMN Formalism
2012 | Article
In Russian-Armenian (Slavonic) University Bulletin, Physical and Mathematical Sciences, ISSN 1829-0450, Number 1, pp. 3-18, Yerevan, 2012
“A New Method for March Test Algorithm Generation and Its Application for Fault Detection in RAMs”
2012 | Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), Volume 31, Number 6, June 2012, pp. 941-949
M. HG, J. Shah, H. Chukhajyan, G. Harutyunyan
“TCAM BIST Methodology and Test Scheme”
2012 | Article
Synopsys Users Group Conference (SNUG), India, 2012
“Fault and Test Algorithm Periodicity Hypothesis in Memory Devices and Its Application to Memory BIST Processor Architecture”
2012 | Article
Reports of National Academy of Sciences of Armenia, 2012, Vol. 112, No. 3, pp. 229-238
"An Efficient Fault Diagnosis and Localization Algorithm for Successive-Approximation Analog to Digital Converters"
2012 | Article
IEEE East-West Design and Test Symposium (EWDTS), Ukraine, 2012, pp. 15-18
K. Amirkhanyan, A. Davtyan, G. Harutyunyan , T. Melkumyan, S. Shoukourian , V. Vardanian , Y. Zorian
"Application of Defect Injection Flow for Fault Validation in Memories"
2012 | Article
IEEE East-West Design and Test Symposium (EWDTS), Ukraine, 2012, pp. 19-22
Karen Amirkhanyan, Karen Darbinyan, Arman Davtyan, Gurgen Harutyunyan , Samvel Shoukourian , Valery Vardanian , Yervant Zorian
“GENERATION OF MEMORY STRUCTURAL MODEL BASED ON MEMORY LAYOUT”
2012 | Article
No. 13/531,189, Filing date – June 22, 2012
T. Melkumyan, V.A. Vardanian
“Histogram based ADC BIST”
2011 | Article
Proc. Int’l Conference on Computer Science and Information Technologies (CSIT’11), Yerevan, Armenia, 2011, pp. 300-303
Թեստային հարցերի և խնդիրների շտեմարան
2011 | Book
Երևան, Ճարտարագետ, 2011:—306 էջ
K. Aleksanyan, V. A. Vardanian , Y. Zorian
“Various methods and apparatuses for effective yield enhancement of good chip dies having memories per wafer”
2011 | Article
US Patent No. 7890900, USA, 2011
 
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YSU, Build. D4, 1 A. Manoogian Street, Yerevan, 0025 Armenia

Tel.: (+374 60) 71-00-44 (inner line 10-44)
it_center@ysu.am