Տեղեկատվական տեխնոլոգիաների կրթական եվ հետազոտական կենտրոն
YSU Information Technologies Educational and Research Center
Established in 2007, IT Educational and Research Center (IT ERC) serves as an interdisciplinary hub for educational program. Headed by Prof. Samvel K. Shoukourian:
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“An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories”
2008 | Article
IEEE VLSI Test Symposium (VTS), USA, 2008, pp. 95 – 100
G. Harutunyan , D. Melkumyan, H. Elchyan, V. Vardanian
“An Efficient Method for Generation of March Tests Based on Formulas”
2008 | Article
Mathematical problems of cybernetics and computer science, Armenia, 2008, pp. 5-17
“Efficient March-Like Algorithm for Detection of All Two-Operation Dynamic Faults from Subclass Sav”,
2008 | Article
Mathematical problems of cybernetics and computer science, Armenia, 2008, pp. 18-24
K. Aleksanyan, V.A. Vardanian
“Yield Improvement Based on Full Repair of SRAMs with Defective Redundancies”
2007 | Thesis
Proceedings of IEEE East-West Design & Test International Symposium, Yerevan, Armenia, 2007
T.A. Gjonjyan, J.T. Sargsyan, V. Vardanian
“Fast Generation of March Tests for Fault Detection and Diagnosis in Static Random Access Memories”
2007 | Thesis
Proceedings of IEEE East-West Design & Test International Symposium, Yerevan, Armenia, 2007
V.A. Vardanian , A. Yessayan
“Innovation and its Impact on the Solutions Proposed by Virage Logic”
2007 | Article
Proc. Armtech Congress’07, Armenian Technology Congress, San Francisco, 2007, 2 p
Manukyan M.G. , Karapetyan S. S.
Some problems of an Extensible Data Model
2007 | Article
In Proc. of the 2nd Annual Scientific Conference of Russian-Armenian (Slavonic) University, 157-165, Yerevan, 2007
“Minimal March Tests for Detection of Dynamic Faults in Random Access Memories”
2007 | Article
Journal of Electronic Testing: Theory and Applications (JETTA), Volume 23, Number 1, February 2007, pp. 55-74
"A March-Based Fault Location Algorithm with Partial and Full Diagnosis for All Simple Static Faults in Random Access Memories”
2007 | Article
IEEE Design and Diagnosis of Electronic Circuits and Systems (DDECS), Poland, 2007, pp. 145-148
“Minimal March Tests for Dynamic Faults in Random Access Memories”
2007 | Article
IEEE European Test Symposium (ETS), Germany, 2007, pp. 223 – 227
 
Contacts
Contacts
YSU, Build. D4, 1 A. Manoogian Street, Yerevan, 0025 Armenia

Tel.: (+374 60) 71-00-44 (inner line 10-44)
it_center@ysu.am