Տեղեկատվական տեխնոլոգիաների կրթական եւ հետազոտական կենտրոն
YSU Information Technologies Educational and Research Center
ԵՊՀ տեղեկատվական տեխնոլոգիաների (SS) կրթական և հետազոտական կենտրոնը ստեղծվել է 2007 թ-ին:
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Hayk A. Grigoryan, Samvel K. Shoukourian
Polynomial algorithm for equivalence problem of deterministic multitape finite automata
2020 | Հոդված/Article
Theoretical Computer Science, Volume 833C, 2020, Pages 120-132
G. Harutyunyan , S. Martirosyan, S. Shoukourian , Y. Zorian
Memory Physical Aware Multi-Level Fault Diagnosis Flow
2020 | Հոդված/Article
IEEE Transactions on Emerging Topics in Computing, VOLUME 8, NO. 3, JULY-SEPT. 2020, pp.700-711
A. Kostanyan , A. Karapetyan
String Matching in Case of Periodicity in the Pattern
2019 | Հոդված/Article
International Conference on Information Technologies ICIT-2019, 61-66 էջ
Samvel Shoukourian , Gurgen Harutyunyan, Grigor Tshagharyan, Yervant Zorian
Finfet-Based Memory Testing Using Multiple Read Operations
2019 | Արտոնագիր/Patent
Samvel Shoukourian , Yuri Shoukourian
Armenia: Communicating to World Community in Electronic Test and Design
2019 | Հոդված/Article
ITC 2019: IEEE International Test Conference, 2019, 1-3 էջ
On an Ontological Modeling Language by a Non-Formal Example
2019 | Հոդված/Article
CEUR Workshop Proceedings, 2019, 2277, 41-48
Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism
2019 | Հոդված/Article
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2019, Volume 38, Number 3, 562-575 էջ
Ontology-based Data Integration
2019 | Հոդված/Article
CEUR Workshop Proceedings, 2019, 2523, 117-128
Hayk Grigoryan, Grigor Tshagharyan, Gurgen Harutyunyan , Samvel Shoukourian , , Yervant Zorian
DETECTION OF ADDRESS ERRORS IN MEMORY DEVICES USING MULTI-SEGMENT ERROR DETECTION CODES
2019 | Արտոնագիր/Patent
Patent No.: US 11/023,310, Date of Patent: June 1, 2021, Appl. No. 16/549,419, filed on August 23, 2019.

Hayk Grigoryan, Grigor Tshagharyan, Gurgen Harutyunyan, Samvel Shoukourian, Yervant Zorian
Armenia: Communicating to World Community in Electronic Test and Design
2019 | Հոդված/Article
ITC 2019: 1-3, IEEE International Test Conference, 2019-11-12, 2019-11-14, Վաշինգտոն