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Публикации
Статья
Analytics for AI Related Applications of Multidimensional Multitape Finite Automata
Статья
Functional Safety Compliant Test & Repair Framework for System-on-Chip Lifecycle Management
Статья
Polynomial algorithm for equivalence problem of deterministic multitape finite automata
Статья
Memory Physical Aware Multi-Level Fault Diagnosis Flow
Статья
Fault Awareness for Memory BIST Architecture Shaped by Multidimensional Prediction Mechanism
Статья
Experimental study on Hamming and Hsiao Codes in the Context of Embedded Applications
Статья
Automated Flow for Test Pattern Creation for IPs in SoC
Статья
An Efficient Testing Methodology for Embedded Flash Memories
Статья
Security Issues in Test and Repair Infrastructure for Systems-on-Chip
Конференция
An efficient approach for memory repair by reducing the number of spares.
Конференция
Extending fault periodicity table for testing faults in memories under 20nm.
Конференция
A power based memory BIST grouping methodology.
Конференция
Overview study on fault modeling and test methodology development for FinFET-based memories.
Конференция
Securing Test Infrastructure of System-on-Chips
Конференция
Armenia: Communicating to World Community in Electronic Test and Design
Патент
Testing Electronic Memories Based on Fault and Test Algorithm Periodicity
Патент
FINFET-BASED MEMORY TESTING USING MULTIPLE READ OPERATIONS
Патент
DETECTION OF ADDRESS ERRORS IN MEMORY DEVICES USING MULTI-SEGMENT ERROR DETECTION CODES
